The Analysette 22 NanoTec from Fritsch offers with the measuring range of 10 nm to 2000 µm true entry into the nano range. This is achieved through the use of a second laser beam that is directed at the sample from behind, allowing for detection of the back-scattering light. The capability to move the measurement cell within the beam path of the optical system during the measurement also results in a very high number of effective detection channels, which can be over 500 for the NanoTec model, which leads to a correspondingly high number of particle size classes and therefore a very high resolution. The special shape of the detector combined with intelligent evaluation software MaS control also allows information to be obtained about the particle shape.
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